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Search for "quantitative Kelvin probe force microscopy" in Full Text gives 2 result(s) in Beilstein Journal of Nanotechnology.

Know your full potential: Quantitative Kelvin probe force microscopy on nanoscale electrical devices

Beilstein J. Nanotechnol. 2018, 9, 1809–1819, doi:10.3762/bjnano.9.172

mode; AM off resonance; AM second eigenmode; cross section; crosstalk; field effect transistor; FM-KPFM; frequency modulation heterodyne; frequency modulation sideband; quantitative Kelvin probe force microscopy; solar cells; Introduction In this study, we compare the most commonly used amplitude

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Published 15 Jun 2018

Beilstein J. Nanotechnol. 2011, 2, 252–260, doi:10.3762/bjnano.2.29

cantilever in quantitative Kelvin probe force microscopy (KPFM) is rigorously analyzed. We use the boundary element method to calculate the point spread function of the measuring probe: Tip and cantilever. The calculations show that the cantilever has a very strong effect on the absolute value of the

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Published 18 May 2011

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